Optics: measuring and testing – Lamp beam direction or pattern
Patent
1987-02-24
1989-02-28
Evans, F. L.
Optics: measuring and testing
Lamp beam direction or pattern
250201, G01J 142
Patent
active
048079928
ABSTRACT:
Mode hopping of a semiconductor laser is detected by detecting at least one of movement of a laser beam emission point of the semiconductor laser in the longitudinal direction, and movement of the laser beam emission point in transverse directions. The semiconductor laser and/or a collimator lens for collimating a laser beam emitted by the semiconductor laser is moved in the longitudinal direction or in the transverse directions to cancel the movement of the laser beam emission point on the basis of a laser beam emission point signal generated by a mode hopping detecting device for detecting the movement of the laser beam emission point.
REFERENCES:
patent: 4272734 (1981-06-01), Jarrett et al.
patent: 4622672 (1986-11-01), Coldren et al.
patent: 4625315 (1986-11-01), Lemberger et al.
patent: 4699446 (1987-10-01), Banton et al.
patent: 4733253 (1988-03-01), Daniele
patent: 4737798 (1988-04-01), Lonis et al.
Horikawa Kazuo
Miyagawa Ichirou
Noguchi Masaru
Evans F. L.
Fuji Photo Film Co. , Ltd.
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