Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1990-07-17
1992-05-19
Turner, Samuel A.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
250237G, G01B 1127
Patent
active
051142350
ABSTRACT:
A method of detecting relative positional deviation of first and second substrates, wherein first and second marks with optical powers are formed on the first and second substrates. A radiation beam is projected to the first substrate and, as a result, the first and second marks produce a signal beam whose position of incidence upon a predetermined plane is changeable with the relative positional deviation of the first and second substrates. A sensor is disposed adjacent to the predetermined plane and receives the signal beam to produce an output signal corresponding to the position of incidence of the signal beam upon the sensor. Here, a reference mark is provided to produce, when irradiated with a radiation beam, a reference beam so that it advances along a light path substantially the same as the light path for the signal beam to the sensor when the first and second substrates are in a predetermined positional relation. The produced reference beam is received by the sensor, whereby a reference signal corresponding to the position of incidence of the reference beam upon the sensor is obtained. The relative position of the first and second substrates can be detected on the basis of the output signal and the reference signal.
REFERENCES:
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patent: 4600309 (1986-07-01), Fay
patent: 4614433 (1986-09-01), Feldman et al.
patent: 4838693 (1989-06-01), Uchida et al.
patent: 4948983 (1990-08-01), Maruyama et al.
Abe Naoto
Suda Shigeyuki
Canon Kabushiki Kaisha
Turner Samuel A.
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