Method of detecting flaws in the structure of a surface

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C382S156000, C356S601000, C356S603000, C706S015000

Reexamination Certificate

active

07149337

ABSTRACT:
The invention relates to a method of detecting flaws in the surface of a test object relative to the surface of a flawless master part by constructing in an artificial neuronal net a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images of the test object recorded by a digital camera.

REFERENCES:
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patent: 5031154 (1991-07-01), Watanabe
patent: 5408424 (1995-04-01), Lo
patent: 5473532 (1995-12-01), Unno et al.
patent: 5790690 (1998-08-01), Doi et al.
patent: 5812992 (1998-09-01), de Vries
patent: 5873824 (1999-02-01), Doi et al.
patent: 5999639 (1999-12-01), Rogers et al.
patent: 196 23 172 (1997-10-01), None
patent: 197 53 620 (1999-10-01), None

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