Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-12-12
2006-12-12
Chawan, Sheela (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S156000, C356S601000, C356S603000, C706S015000
Reexamination Certificate
active
07149337
ABSTRACT:
The invention relates to a method of detecting flaws in the surface of a test object relative to the surface of a flawless master part by constructing in an artificial neuronal net a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images of the test object recorded by a digital camera.
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patent: 196 23 172 (1997-10-01), None
patent: 197 53 620 (1999-10-01), None
Albrecht Peter
Lilienblum Tilo
Michaelis Bernd
Chawan Sheela
Collard & Roe P.C.
INB Vision AG
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