Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-07-18
2010-12-14
Ahmed, Samir A. (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S276000
Reexamination Certificate
active
07853084
ABSTRACT:
It is an object of the present invention to detect an image correction method from corrected images, in order to grasp a correction method of a correctly corrected images as a guideline for correction of a harmful image, and to present an image correction proposal to which a correction method in the past is applied, in order to indicate to a corrector a guideline for correction of the harmful image. In order to achieve the above-described objective, the present invention employs the following configuration. With respect to a harmful image data before correction and an image data after correction, a scene feature quantity representing the feature quantity of a scene for each scene of a video is calculated, and by comparing chronological lists of the respective scene feature quantities of the videos, a correction method for the scene configuration is detected.
REFERENCES:
patent: 4807033 (1989-02-01), Keesen et al.
patent: 6140991 (2000-10-01), Miyabe
patent: 6937764 (2005-08-01), Sakamoto et al.
patent: 2002/0141619 (2002-10-01), Standridge et al.
patent: 2003/0123726 (2003-07-01), Suh
patent: 0 989 759 (2000-03-01), None
patent: 1 653 727 (2006-05-01), None
patent: 9-284667 (1997-10-01), None
patent: 2002-330453 (2002-11-01), None
patent: 2005-284394 (2005-10-01), None
patent: 10-2005-0018656 (2005-02-01), None
patent: WO 03/090168 (2003-10-01), None
Igawa Masaru
Oki Yasuyuki
Shiraishi Masao
Ahmed Samir A.
Antonelli, Terry Stout & Kraus, LLP.
Hitachi , Ltd.
Lee John W
LandOfFree
Method of detecting feature images does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of detecting feature images, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of detecting feature images will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4181406