Thermal measuring and testing – Leak or flaw detection
Patent
1996-07-31
1998-10-06
Gutierrez, Diego F.F.
Thermal measuring and testing
Leak or flaw detection
374121, 374 5, G01N 2572
Patent
active
058167030
ABSTRACT:
A method of detecting a defect on the surface of a structure using an infrared radiometric thermometer. It is determined that there is a lifting defect at a region of the surface if the region has a temperature difference of 0.3.degree. C. or more in comparison with a surrounding region and has an area of 200 cm.sup.2 or more. The temperature of the surface of the structure is obtained using the infrared radiometric thermometer in a period of time from 19:00 p.m. on a day when it is clear at least in the daytime to 4:30 a.m. on the next day.
REFERENCES:
patent: 3504524 (1970-04-01), Maley
patent: 4872762 (1989-10-01), Koshihara et al.
Harashima Susumu
Kawase Kiyotaka
Koike Toshio
Yamazaki Kenichiro
Gutierrez Diego F.F.
Nittco Chemical Industry Co., Ltd.
LandOfFree
Method of detecting defects of a structure does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of detecting defects of a structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of detecting defects of a structure will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-71266