Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-12-26
2006-12-26
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C702S185000
Reexamination Certificate
active
07154292
ABSTRACT:
A system and method for detecting defects in TFT-array panels is provided that improves defect detection accuracy by adjusting the thresholding parameters used to classify defective pixels in accordance with the standard deviation of the measured pixel voltages. The present invention is particularly suited for the testing of TFT-array panels that contain more pixels than can be measured by the sensor of the TFT-array tester in a single measurement. The system and method of the present invention calculates the standard deviation of the measured pixel voltages at each measurement point, and adjusts the thresholding parameters based on the calculated standard deviation. Accordingly, the system and method of the present invention helps to compensate for differences in the measured pixel voltages between measurement points due to environmental factors or other causes.
REFERENCES:
patent: 6275061 (2001-08-01), Tomita
patent: 6388646 (2002-05-01), Fujiwara et al.
Fleshner & Kim LLP
Tang Minh N.
Yieldboost Tech Inc.
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