Method of detecting defects in materials using infrared thermogr

Measuring and testing – Instrument mechanism or transmission – Rate of change

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

374 5, G01N 2572

Patent

active

058346619

ABSTRACT:
A method of detecting defects in materials using infrared thermography, includes placing the rear surface of an object to be inspected close to the front surface of a thermoplate controlled by a temperature controller, and the front surface of the object in a vacuum chamber. At the other end of the vacuum chamber, on the outside, an infrared camera is arranged facing the object, so that a vacuum is maintained between the object and the camera. Defects are detected from thermal images of the object, obtained with the infrared camera.

REFERENCES:
patent: 5144149 (1992-09-01), Frosch
patent: 5292195 (1994-03-01), Crisman, Jr.
patent: 5505543 (1996-04-01), Webbeking

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of detecting defects in materials using infrared thermogr does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of detecting defects in materials using infrared thermogr, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of detecting defects in materials using infrared thermogr will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1518350

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.