Method of detecting defective pixels of a solid-state...

Details Method of detecting defective pixels of a solid-state... Method of detecting defective pixels of a solid-state...

2005-09-27

2005-09-27

Vu, Ngoc-Yen (Department: 2612)

Television

Camera, system and detail

Combined image signal generator and general image signal...

C348S250000, C348S280000

Reexamination Certificate

active

06950133

ABSTRACT:
A defective pixel detecting method and an image-pickup apparatus having a plurality of solid-state image-pickup devices each receiving respective one of spectral lights obtained by separating light incident to the image-pickup apparatus, generating, for each spectral light, a value relating to an inspected defective pixel on an associated solid-state image-pickup device located at a corresponding same image-pickup point among the plurality of solid-state image-pickup devices based on a signal level produced from the inspected pixel and signal levels produced from a plurality of pixels of the associated solid-state image-pickup device in the vicinity of the inspected pixel, and determining the solid-state image-pickup device that generated a defective pixel based on the values obtained with respect to the plurality of solid-state image-pickup devices.

REFERENCES:
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European Search Report, EPO1 11 7719, Hitachi Kokusai Electric, Inc., Appl. No. 01117719.3-1241, Ref. A36277EP.

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