Method of detecting abnormal pattern candidates

Image analysis – Applications – Biomedical applications

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C382S128000, C128S922000, C600S407000

Reexamination Certificate

active

09953909

ABSTRACT:
Processing for detecting an abnormal pattern candidate embedded in a medical image having been obtained from an image recording operation is performed on an image signal representing the medical image. In cases where the image signal is one which has been subjected to predetermined signal processing, correction processing is performed on the image signal such that the abnormal pattern candidate detecting processing performed on the image signal, which has been subjected to the predetermined signal processing, does not depend upon the predetermined signal processing. The abnormal pattern candidate detecting processing is then performed on the image signal, which has been obtained from the correction processing.

REFERENCES:
patent: 4537203 (1985-08-01), Machida
patent: 5046147 (1991-09-01), Funahashi et al.
patent: 5714764 (1998-02-01), Takeo et al.
patent: 5790690 (1998-08-01), Doi et al.
patent: 5850465 (1998-12-01), Shimura et al.
patent: 5997478 (1999-12-01), Jackson et al.
patent: 6058322 (2000-05-01), Nishikawa et al.
patent: 6141437 (2000-10-01), Xu et al.
patent: 6185320 (2001-02-01), Bick et al.
Medical Imaging Technology, vol. 12, No. 1, pp. 59, 1994.
Transactions of The Institute of Electronics, Information, and Communication Engineers of Japan, D-II, vol. J75-D-II, No. 3, pp. 663, 1992.
Transactions of The Institute of Electronics, Information, and Communication Engineers of Japan, D-II, vol. J75-DII, No. 7, pp. 1170, 1992.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of detecting abnormal pattern candidates does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of detecting abnormal pattern candidates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of detecting abnormal pattern candidates will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3776345

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.