Method of designing semiconductor integrated circuit having...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing

Reexamination Certificate

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C716S108000, C716S109000, C716S113000, C716S114000, C716S133000

Reexamination Certificate

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08086984

ABSTRACT:
A power noise cycle is obtained from a dynamic IR drop analysis and a delay of a delay pass is a multiple of the noise cycle. Thereby, a delay increment and a delay decrement of a power noise amount (delay time×power noise amplitude) received when an internal signal of the semiconductor integrated circuit passes through a delay pass circuit are approximately the same.

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patent: 7079998 (2006-07-01), Tien et al.
patent: 2003/0154065 (2003-08-01), Gauthier et al.
patent: 2004/0212428 (2004-10-01), Ode et al.
patent: 2006/0028254 (2006-02-01), Feng
“Voltagestorm power and Power Rail Verification Datasheet”, pp. 1-4, Cadence, @2006.
“Dynamic IR-drop Analysis with Voltagestorm Dynamic Gate (VSDG) using different Power Grid Views for Cell Modeling”, by Steffen Kosinski, @ May 16, 2007.
“Method For Converging Timing In Consideration Of Signal Integrity” OKI Technical View No. 196, vol. 70, No. 4, pp. 50-51, Oct. 2003.

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