Method of depositing low stress hafnium thin films

Chemistry: electrical and wave energy – Processes and products – Vacuum arc discharge coating

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17910041G, 274 38, 428469, 358256, C23C 1500, B32B 900

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active

040564576

ABSTRACT:
By radio frequency sputtering hafnium films on an alumina or sapphire substrate at high deposition rates and minimum substrate target bias, improved adhesion of the hafnium films to the substrate is obtained.

REFERENCES:
patent: 3647662 (1972-03-01), Gerstenberg et al.
F. Huber et al., "Thin Film Hafnium-Hafnium Dioxide Capacitors," Proc. IEEE Components Conf, (1966), pp. 324-334.
F. T. J. Smith, "Structure & Electrical Properties of Sputtered Films of Hafnium & Hafnium Compounds," J. Appl. Phys, vol. 41, pp. 4227-4231, (1970).
M. T. Thomas, "Preparation & Properties of Sputtered Hafnium & Anodic HfO.sub.2 Films," J. Electrochem. Soc., vol. 117, pp. 396-403, (1970).

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