Method of depositing dielectric

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S400000

Reexamination Certificate

active

06936481

ABSTRACT:
This invention relates to a method of depositing dielectric on a semiconductor substrate to form part of a capacitor. The method includes reactive sputtering a metal oxide layer from a target of metal onto the substrate wherein the support is biased to induce a DC voltage across the depositing dielectric as it forms. The voltage may be in the range of 200-300V.

REFERENCES:
patent: 4002545 (1977-01-01), Fehiner et al.
patent: 4959745 (1990-09-01), Suguro
patent: 5078846 (1992-01-01), Miller et al.
patent: 5180476 (1993-01-01), Ishibashi et al.
patent: 5185689 (1993-02-01), Maniar
patent: 5286531 (1994-02-01), Krug et al.
patent: 5559058 (1996-09-01), Zory et al.
patent: 5789071 (1998-08-01), Sproul et al.
patent: 5942089 (1999-08-01), Sproul et al.
patent: 6075691 (2000-06-01), Duenas et al.
patent: 6171872 (2001-01-01), Lowrey et al.
patent: 6211035 (2001-04-01), Moise et al.
patent: 6246076 (2001-06-01), Lipkin et al.
patent: 6266230 (2001-07-01), Kato et al.
patent: 6291867 (2001-09-01), Wallace et al.
patent: 6319766 (2001-11-01), Bakli et al.
patent: 6346427 (2002-02-01), Gardner et al.
patent: 6407420 (2002-06-01), Yamanaka et al.
patent: 6537428 (2003-03-01), Xiong et al.
patent: 6622059 (2003-09-01), Toprac et al.
patent: 6624462 (2003-09-01), Kohara et al.
patent: 6730955 (2004-05-01), Shinohara et al.
patent: 0 691 419 (1996-01-01), None
patent: 2000-82630 (2000-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of depositing dielectric does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of depositing dielectric, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of depositing dielectric will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3453896

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.