Method of creating debug specification and test program creating

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Details

364191, 364578, 395919, 395922, G05B 1700

Patent

active

053981979

ABSTRACT:
A method of creating a debug specification includes the steps of reading in either a measurement specification or a test program, extracting setting conditions for each measuring parameter from the read measurement specification or the test program, extracting terminals of a circuit to be measured required for debugging as checking terminals, extracting the setting conditions of the extracted checking terminals as checking conditions, determining whether the checking terminals and the checking conditions for each extracted measuring parameter are changed from the corresponding previous measuring parameter of the previous stage, extracting the changed checking terminals and the checking conditions as changing conditions when the checking terminals and the checking conditions have changed and extracting a changing timing at which the change takes place, and outputting all the changing conditions and the changing timings extracted for all the measuring parameters as a debug specification. A test program creating specification can be created in a similar manner.

REFERENCES:
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patent: 5020009 (1991-05-01), Ogata et al.
patent: 5020010 (1991-05-01), Ogata et al.
patent: 5038296 (1991-08-01), Sano
patent: 5053981 (1991-10-01), Ogata et al.
patent: 5084813 (1992-01-01), Ono
patent: 5267175 (1993-11-01), Hooper

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