Computer graphics processing and selective visual display system – Computer graphics processing – Attributes
Reexamination Certificate
2005-04-26
2005-04-26
Chauhan, Ulka J. (Department: 2676)
Computer graphics processing and selective visual display system
Computer graphics processing
Attributes
C345S611000, C345S614000, C345S503000, C345S531000, C345S564000, C345S566000
Reexamination Certificate
active
06885384
ABSTRACT:
A system and method are disclosed for reproducing a pre-selected larger 2-D sample location pattern from a smaller one by means of X,Y address permutation. This method, for example, allows hardware to effectively reproduce a pre-selected set of sample locations for an array of 128×128 sample bins from a smaller set of pre-selected sample locations for an array of 2×2 sample bins. A permutation logic unit may use a first portion of an address for a sample bin B to identify a corresponding 2-D transformation, apply the inverse of the transformation to a second portion of the sample bin address to identify the corresponding bin of the 2×2 array of sample bins, and apply the transformation to the sample locations stored in the corresponding bin to reproduce the sample locations pre-selected for sample bin B.
REFERENCES:
patent: 4897806 (1990-01-01), Cook et al.
patent: 5025400 (1991-06-01), Cook et al.
patent: 5239624 (1993-08-01), Cook et al.
patent: 5757375 (1998-05-01), Kawase
patent: 6091425 (2000-07-01), Law
patent: 6501483 (2002-12-01), Wong et al.
patent: 6593933 (2003-07-01), Xu et al.
patent: 6768491 (2004-07-01), Lefebvre et al.
patent: 20020140706 (2002-10-01), Peterson et al.
Michael F. Deering and Scott R. Nelson. Leo: A System for Cost Effective 3D Shaded Graphics. In Proceedings of the 20th Annual Conference on Computer Graphics and Interactive Techniques. Sep. 1993, pp 101-108.*
Alexander Keller. Instant Radiosity. In Proceedings of the 24th Annual Conference on Computer Graphics and Interactive Techniques. Aug. 1997.
Deering Michael F.
Naegle Nathaniel David
Oberoi Ranjit S.
Chauhan Ulka J.
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Sun Microsystems Inc.
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