Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-07-12
2010-10-19
Werner, Brian P (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C700S121000, C228S904000
Reexamination Certificate
active
07817846
ABSTRACT:
A method of correcting bonding coordinates according to locations of a die and leads loaded for bonding is provided. The method includes searching for locations of die recognition areas and lead recognition areas, comparing the detected locations of the recognition areas, and correcting bonding coordinates of the die and the leads according to the result obtained by the comparison; and if a search for the locations of the die recognition areas fails, searching for reference bond pads, comparing locations of the detected reference bond pads with setting locations, and correcting bonding coordinates of a die and leads to be bonded according to the result obtained by the comparison.
REFERENCES:
patent: 4091394 (1978-05-01), Kashioka et al.
patent: 4163212 (1979-07-01), Buerger et al.
patent: 4213117 (1980-07-01), Kembo et al.
patent: 4334241 (1982-06-01), Kashioka et al.
patent: 4390955 (1983-06-01), Arimura
patent: 4450579 (1984-05-01), Nakashima et al.
patent: 4651341 (1987-03-01), Nakashima et al.
patent: 5119436 (1992-06-01), Holdgrafer
patent: 5292050 (1994-03-01), Nagaoka et al.
patent: 5621813 (1997-04-01), Brown et al.
patent: 5754677 (1998-05-01), Kawada
patent: 5754679 (1998-05-01), Koljonen et al.
patent: 5903662 (1999-05-01), DeCarlo
patent: 6250534 (2001-06-01), Sasano
patent: 6289492 (2001-09-01), Dutta-Choudhury et al.
patent: 6574524 (2003-06-01), Kim
patent: 6629013 (2003-09-01), Koduri et al.
patent: 6820792 (2004-11-01), Kim et al.
patent: 6868176 (2005-03-01), Sugawara
patent: 7069102 (2006-06-01), Bon et al.
patent: 2002/0014515 (2002-02-01), Koduri
patent: 1999-0057772 (1999-07-01), None
Flack et al. (May 1995) “Application of pattern recognition in mix-and-match lithography.” SPIE vol. 2440 pp. 913-927.
Cho Jeong-ho
Chung Yong-bok
Drennan Barry
Drinker Biddle & Reath LLP
Samsung Techwin Co. Ltd.
Werner Brian P
LandOfFree
Method of correcting bonding coordinates using reference... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of correcting bonding coordinates using reference..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of correcting bonding coordinates using reference... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4181695