Method of correcting an error in phase difference in a phase...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C430S030000, C382S144000

Reexamination Certificate

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07998643

ABSTRACT:
Disclosed is a method of correcting an error in a phase difference in a phase shift mask, in which a phase shift pattern is formed on a light transmitting substrate, wherein the method includes: determining generation of an error in a phase difference by measuring a phase of a light transmitted through the light transmitting substrate and a phase of a light transmitted through the phase shift pattern; and correcting the error in the phase difference by coating a self-assembled monolayer on the light transmitting substrate when the error of the phase difference is generated.

REFERENCES:
patent: 7389491 (2008-06-01), Park et al.
patent: 7691541 (2010-04-01), Crocker et al.

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