Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate
2008-05-13
2008-05-13
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By alignment in lateral direction
C250S201900
Reexamination Certificate
active
07372569
ABSTRACT:
An optical alignment apparatus comprising a plurality of subapertures and a plurality of detectors. The subapertures are optically coupled to a reflective surface which formed by a plurality of adjustable reflective segments. Each subaperture falls within one of two subsets. The first subset includes those subapertures that are positioned to receive light reflected from a single reflective segment. The second subset includes those subapertures that are positioned to receive light reflected across the abutting edges of adjacent reflective segments. Each detector is disposed at a focal plane of one of the subapertures and receives light reflected from that subaperture.
REFERENCES:
patent: 5128530 (1992-07-01), Ellerbroek et al.
Aberration correction of segmented-aperture telescopes by using phase diversity□□David A. Carrara, Brian J. Thelen, Richard G. Paxman□□Veridian ERIM International, P.O. Box 134008, Ann Arbor, MI 48113.
Chowdhury Tarifur
Connolly Bove & Lodge & Hutz LLP
Cook Jonathon D
Optical Physics Company
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