Method of controlling and/or measuring layer thickness such as t

Details Method of controlling and/or measuring layer thickness such as t Method of controlling and/or measuring layer thickness such as t

1987-10-30

1989-03-21

Bell, Janyce

Coating processes

Measuring, testing, or indicating

Thickness or uniformity of thickness determined

427 8, 427 10, 427160, B05D 100, B05B 500

Patent

active

048141984

ABSTRACT:
When controlling and/or determining the thicknesses of layers or surface coatings there is chosen a coating composition that incorporates a fluorescing indicator substance, the proportions of which in the coating composition can be measured by X-ray fluorescence. The coating composition is applied to a substrate surface in solution, slurry or molten form and the thickness of the coating, or layer, is controlled and/or monitored in accordance with the intensity of the light which fluoresces from the coating.

REFERENCES:
patent: 2897371 (1959-07-01), Hasler
patent: 3019336 (1962-01-01), Johns
patent: 4135006 (1979-01-01), Readal et al.
patent: 4250382 (1981-02-01), Libby
patent: 4292341 (1981-09-01), Marcuse et al.

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