Method of constructing testing procedures for analog circuits by

Details Method of constructing testing procedures for analog circuits by Method of constructing testing procedures for analog circuits by

1997-08-05

2000-04-04

Teska, Kevin J.

39550003, 39550023, G06F 9455

Patent

active

06047114&

ABSTRACT:
The present invention discloses a method of constructing the testing procedure of an analog circuit by applying the fault classification tables of the analog circuit. The constructing method classifies the fault classification tables to establish a decision tree. Entropy definitions are defined and the decision tree is thus established by following the rule of decreasing the entropy values. A search procedure of the decision tree can be performed as to find the failure mode next time when the analog circuit is detected.

REFERENCES:
patent: 5099436 (1992-03-01), McCown et al.
patent: 5511162 (1996-04-01), Hamada et el.
patent: 5515384 (1996-05-01), Horton, III
patent: 5544308 (1996-08-01), Giordano et al.
Sujoy Sen, "Simulation-Based Testability Analysis and Fault Diagnosis", IEEE, pp. 136-148, 1996.

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