Method of computerized in-circuit testing of electrical componen

Details Method of computerized in-circuit testing of electrical componen Method of computerized in-circuit testing of electrical componen

1982-04-30

1985-11-26

Atkinson, Charles E.

Excavating

371 20, G01R 3128

Patent

active

045557837

ABSTRACT:
This disclosure is concerned with suppressing spurious signals generated during the in-circuit testing of circuit components, and which spurious signals may interfere with test signals being forced at selected nodes of the circuit that are inputs to components being tested and wherein such spurious signals may be routed via certain of the other circuit components, by automatically inhibiting either potential transmission of spurious signals by applying specific signals to components identified by analysis as normally feeding or processing input signals to the component(s) under test, or automatically inhibiting all inhibitable input parts of all components identified as those capable of passing such spurious signals to the input of the component(s) under test.

REFERENCES:
patent: 3931506 (1976-01-01), Borrelli et al.
patent: 4070565 (1978-01-01), Borrelli
patent: 4216539 (1980-08-01), Raymond et al.
patent: 4236246 (1980-11-01), Skilling
GenRad 2270 In-Circuit Test System brochure.
A. Mastrocola, "Effective Utilization of In-Circuit Techniques When Testing Complex Digital Assemblies", Automatic Testing & Test and Measurement '81 Session 2, Mar. 1981, pp. 106-117.
Brochure-PSC Quarterly, vol. 1, No. 3, Jul. 1980, Production Services Corporation, Waltham, MA.

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