Method of cleaning processing chamber of semiconductor...

Cleaning and liquid contact with solids – Processes – Using sequentially applied treating agents

Reexamination Certificate

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C134S002000, C134S003000, C134S021000, C134S022100, C134S022170, C134S022180, C134S025400, C134S028000, C134S029000, C134S031000, C134S034000, C134S035000, C134S036000, C134S037000, C134S041000, C134S042000

Reexamination Certificate

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06899767

ABSTRACT:
A method of cleaning the interior of a processing chamber first performs a halogenation treatment by supplying a treatment gas containing a halogenating gas into the processing chamber and heating a support member for a target substrate, thereby halogenating a metal element in a by-product film. A reduction treatment is then performed by supplying a treatment gas containing a reducing gas into the processing chamber, thereby reducing a halide of the metal element and liberating the metal element. An oxidation treatment is then performed by supplying a treatment gas containing an oxidizing gas into the processing chamber and heating the casing walls of the processing chamber, thereby passivating the liberated metal element by oxidation.

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patent: 5756400 (1998-05-01), Ye et al.
patent: 5843239 (1998-12-01), Shrotriya
patent: 5849092 (1998-12-01), Xi et al.
patent: 2002/0117472 (2002-08-01), Sun et al.
patent: 1-152274 (1989-06-01), None
patent: 2-190472 (1990-07-01), None
patent: 5-144802 (1993-06-01), None
patent: 11-135437 (1999-05-01), None
patent: 2000-173925 (2000-06-01), None

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