Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1990-12-07
1993-04-27
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356377, 356237, G01B 1124, G01N 2100
Patent
active
052067050
ABSTRACT:
The upper-limit height of a solder portion based on the thickness of a lead or a chip is set, and the maximum height of the solder portion measured with a laser beam is compared with the set upper-limit height, thereby to judge the acceptance or rejection of the shape of the solder portion. In addition, the lower-limit height of a solder portion based on the thickness of a lead or a chip is set, and the maximum height of the solder portion measured with a laser beam is compared with the set lower-limit height, thereby to judge the acceptance or rejection of the shape of the solder portion. Besides, the lower-limit wetting angle of a solder fillet is set, and the wetting angle of the solder fillet measured with a laser beam is compared with the set lower-limit wetting angle, thereby to judge the acceptance or rejection of the shape of the solder fillet.
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Park, et al., "A Solder Joint Inspection System for Automated Printed Circuit Board Manufacturing," IEEE International Conference on Robotics and Automation, pp. 1290-1295, May 1990.
Matsushita Electric - Industrial Co., Ltd.
Pham Hoa Q.
Rosenberger Richard A.
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