Coating processes – Measuring – testing – or indicating
Patent
1997-02-05
1998-07-07
Pianalto, Bernard
Coating processes
Measuring, testing, or indicating
427130, 427131, 427132, 427259, 427264, 427270, 427272, 427282, 427404, 427548, 427599, B05D 512
Patent
active
057765375
ABSTRACT:
An MR sensor includes an MR layer and permanent magnets defining an active area on the MR layer. A bi-layer test structure is fabricated with a permanent magnet layer deposited on a substrate and an MR layer deposited on the permanent magnet layer. If desired, a SAL may be deposited prior to deposition of the permanent magnet layer. A DC magnetic field is applied to the bi-layer test structure, and the strength of the DC magnetic field is varied. During application of the DC magnetic field, the magnetic response of the bi-layer test structure is measured to determine a hysteresis loop of the bi-layer structure. The exchange coupling between the permanent magnet layer and the MR layer is characterized by a point of inflection identified on the measured hysteresis loop.
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Mowry Greg S.
Ryan Patrick J.
Yang Zhijun
Pianalto Bernard
Seagate Technology Inc.
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