Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2008-12-04
2010-11-30
Kundu, Sujoy K (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S085000, C702S086000, C702S088000, C702S099000, C702S103000, C702S104000, C702S127000, C702S189000, C702S199000, C073S001010, C073S001820, C073S001880, C703S002000, C703S004000, C714S001000
Reexamination Certificate
active
07844414
ABSTRACT:
A method of calibrating an individual sensor of a particular sensor type whose output varies non-linearly with at least one measured quantity and at least one operating condition. The first step includes producing a set of calibration curves for each sample sensor of the particular sensor type. The resulting sets of calibration curves are then averaged and the results used to produce a generic calibration surface for the particular sensor type showing its variation. Individual calibration measurements are then taken for a number of different values of the measured quantity at a small number of discrete values. The individual calibration readings are then used to map the generic calibration surface to the individual calibration measurements of the individual sensor.
REFERENCES:
Kalinin et al, “Contactless Torque and Temperature Sensor Based on SAW Resonators,” IEEE Ultrasonice Symposium, pp. 1490-1493. 2006.
Keusey & Associates, P.C.
Kundu Sujoy K
Transense Technologies PLC
LandOfFree
Method of calibrating temperature compensated sensors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of calibrating temperature compensated sensors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of calibrating temperature compensated sensors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4243962