Method of calibrating output levels of a waveform analyzing appa

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration

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324603, 324623, 341120, G01R 2316

Patent

active

051382679

ABSTRACT:
The present invention relates to a method of calibrating levels of a waveform analyzing apparatus. An analog switch produces a square wave signal of a low frequency by switching ON and OFF a preset level of DC voltage from a DC voltage setting circuit at a frequency of a control signal from a frequency setting circuit. The square wave signal is applied to the waveform analyzing apparatus and the low frequency output level is calibrated by a theoretical level of a frequency spectrum of the square wave signal. A diode detecting circuit is calibrated at the low frequency using the calibrated waveform analyzing apparatus, which in turn is calibrated at a high frequency using the calibrated diode detecting circuit. The diode detecting circuit, the analog switch and a switch circuit are provided on a performance board attached to an IC tester analog test part which includes the signal generators, the DC voltage setting circuit, the frequency setting circuit, the waveform analyzing apparatus, a DC voltmeter and a test processor. Using the switch circuit, desired outputs of the signal generators, analog switch and the diode detecting circuit are connected to desired inputs of the waveform analyzing apparatus, DC voltmeter and the diode detecting circuit, thus forming calibration equipment.

REFERENCES:
patent: 3349195 (1967-10-01), Gray
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patent: 4023093 (1977-05-01), Roth
patent: 4067060 (1978-01-01), Poussart
patent: 4450411 (1984-05-01), Spurr
patent: 4583075 (1986-04-01), Sloane
patent: 4633173 (1986-12-01), Kashiwagi
patent: 4700129 (1987-10-01), Yoshizawa
patent: 4799008 (1989-01-01), Kannari

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