Measuring and testing – Simulated environment
Patent
1992-05-15
1993-06-22
Noland, Tom
Measuring and testing
Simulated environment
2502521, G01N 1700
Patent
active
052208400
ABSTRACT:
The light output of a multi-lamp lightfastness testing chamber defining a sample testing area in the chamber may be performed by sequentially turning on and off each lamp by itself, while measuring from the sample testing area the irradiation provided by each lamp, while adjusting the intensity of irradiation for each lamp to a desired level. Thereafter, individual lamp sensors (56) sense the light intensity of each individual lamp. Typically by a feedback circuit, the power to each lamp is adjusted so that the sensed light intensity of each lamp is maintained within predetermined limits corresponding to the irradiation level measured from the sample testing area.
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Brochure entitled SunSystem by Atlas Electric Devices Company of Chicago, Ill.; 4 pages; copyright Feb. 1988.
Comerford Gene
Huber James V.
Neigoff Eugene N.
Vlahos Victor H.
Atlas Electric Devices Co.
Noland Tom
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