Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-09-07
1997-09-02
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356243, G01B 1114
Patent
active
056637950
ABSTRACT:
An improved method of calibrating the location of a laser projector relative to a workpiece utilizes a series of randomly-placed reference points, with at least two of the points being spaced by a known distance. Known calibration equations allow the identification of the location of the laser relative to the workpiece by identifying the location of the laser relative to the points, and also utilizing the known distance. The laser may be utilized with at least one other component. The second component might be a second laser. If there are reference points fixed relative to a frame of reference then the laser may also be utilized to accurately display information on the workpiece.
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Pham Hoa Q.
Virtek Vision Corp.
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