Geometrical instruments – Gauge – With calibration device or gauge for nuclear reactor element
Reexamination Certificate
2007-11-27
2009-06-09
Bennett, G. Bradley (Department: 2841)
Geometrical instruments
Gauge
With calibration device or gauge for nuclear reactor element
C033S503000, C073S001790
Reexamination Certificate
active
07543393
ABSTRACT:
A method of measuring an object using a surface sensing device mounted on a coordinate positioning apparatus. The method has the steps of measuring a single surface point of a feature of the object with the surface sensing device, moving the surface sensing device along a path around the feature at a fast speed, thereby taking measurements along the path, including at the surface point, determining the difference between the measurements of the surface point and using the difference determined to apply a correction to the object or subsequent objects having the same feature.
REFERENCES:
patent: 4603487 (1986-08-01), Matsunata
patent: 4819195 (1989-04-01), Bell et al.
patent: 6484571 (2002-11-01), Hidaka et al.
patent: 6601311 (2003-08-01), McMurtry et al.
patent: 6701267 (2004-03-01), Noda et al.
patent: 6701268 (2004-03-01), Noda et al.
patent: 6909983 (2005-06-01), Sutherland
patent: 7055367 (2006-06-01), Hajdukiewicz et al.
patent: 7254506 (2007-08-01), McMurtry et al.
patent: 7318284 (2008-01-01), McMurtry et al.
patent: 2002/0174555 (2002-11-01), McMurtry et al.
patent: 2003/0009257 (2003-01-01), Sutherland et al.
patent: 2004/0244464 (2004-12-01), Hajdukiewicz et al.
patent: 2006/0053646 (2006-03-01), McFarland
patent: 2006/0266100 (2006-11-01), McMurtry et al.
patent: 2008/0083127 (2008-04-01), McMurtry et al.
patent: 0 318 557 (1992-04-01), None
patent: WO 90/07097 (1990-06-01), None
patent: WO 92/20996 (1992-11-01), None
patent: WO 00/25087 (2000-05-01), None
patent: WO 00/62015 (2000-10-01), None
patent: WO 03/038375 (2003-05-01), None
patent: WO 2004/005849 (2004-01-01), None
Jonas Kevyn B.
McFarland Geoffrey
McMurtry David R.
Somerville Leo C.
Bennett G. Bradley
Oliff & Berridg,e PLC
Renishaw PLC
LandOfFree
Method of calibrating a scanning system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of calibrating a scanning system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of calibrating a scanning system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4127457