X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1992-11-20
1996-06-18
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Absorption
378207, G01N 2306
Patent
active
055286496
ABSTRACT:
The calibration method consists in measuring the efficiency D of a detector cell placed behind the object as a function of various phantom thicknesses E.sub.p and various X-ray tube supply voltages V.sub.m. These measurements enable an analytic model D=f(V.sub.m, E.sub.p) to be determined describing the resulting curves. The inverse function of this analytic model can be used for calculating thickness E.sub.p as a function of the measured efficiency D and the known supply voltage V.sub.m.
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Church Craig E.
Farley Walter C.
General Electric CGR SA
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