Method of calculating device metrics

Details Method of calculating device metrics Method of calculating device metrics

2005-09-27

2005-09-27

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C714S047300

Reexamination Certificate

active

06950781

ABSTRACT:
A method and system of calculating device metric is disclosed. In accordance with one embodiment, life-cycle data for devices are acquired; then, the devices are qualified based on the completeness and consistency of the data for calculating the metric. The metric is then calculated using the qualified devices data.

REFERENCES:
patent: 5210704 (1993-05-01), Husseiny
patent: 6675129 (2004-01-01), Cambon et al.
patent: 6684349 (2004-01-01), Gullo et al.
Huaiquing Wu, et al.; “Early Detection of Reliability Problems Using Information From Warranty Databases”; Mar. 23. 2001; Iowa State University, Department of Statistics; pp. 1-28.

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