Method of bonding a semiconductor die to a package using a gold/

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437248, 437926, 29740, 29840, 228123, 228254, 228231, 228232, 228200, 432 18, 432 77, H01L 2152, H01L 2158, H01L, H01L, H01L 21607

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051889820

ABSTRACT:
An Au/si die attach method for attaching a die to a package including preheating the package, melting an Au/Si preform in the package cavity, scratching the die onto the package cavity to form a die attach bond, and gradually cooling an Au/Si die bond by reducing heat supplied to the package, so as to cool the package through a monotonically decreasing sequence of temperatures, wherein the package is maintained for a predetermined period of time at each temperature in the sequence.
A heating block with segments supplies a decreasing amount of heat to the packages to let the die attached bond gradually cool. The packages are kept on top of the segments of the heating block for a predetermined period of time and each segment is heated to a specific temperature. The gradual cooling of the die attach bond decreases the thermal resistance and prevents the creation of voids in the die attach bond.

REFERENCES:
patent: 4771018 (1988-09-01), Bhattacharyya et al.
patent: 4810671 (1989-03-01), Bhattacharyya et al.
Mahalingam, M. et al., "Thermal Effect of Die Bond Voids," Semiconductor International, Sep. 1984, pp. 71-79.
Huang, C. C. and N. K. Sharma, "Thermal Enhancement Methods for ECL Gate Array Packaging," IEEE Semiconductor Thermal and Temperature Measurement Symposium, Proceedings 1988, pp. 78-83.

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