Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-07-29
1998-08-25
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324763, 324765, 437 8, 437207, G01R 3102
Patent
active
057986525
ABSTRACT:
The present invention is used with single devices mounted on a ceramic substrate. The devices are broken out of the sheet, after all testing, electrical conditioning, and screening, as small surface mount devices. Conductive strips are formed on the ceramic substrate and are spaced to match a standard circuit board edge connector. These strips are electrically connected to the devices to allow testing and burn-in in sheet form rather than testing each device individually. The design reduces handling of the individual devices. The invention allows all of the testing and assembly to be done in a "batch" fashion. The board that is used to test the devices is separated to create the package for the individual components. The technique of the invention reduces cost and handling damage.
REFERENCES:
patent: 3839781 (1974-10-01), Russell
patent: 4329642 (1982-05-01), Luthi
patent: 4426773 (1984-01-01), Hargis
patent: 4677528 (1987-06-01), Miniet
patent: 4682207 (1987-07-01), Akasaki
patent: 4764723 (1988-08-01), Strid
patent: 4926117 (1990-05-01), Nevill
patent: 4992850 (1991-02-01), Corbett
patent: 5175491 (1992-12-01), Ewers
patent: 5280193 (1994-01-01), Lin
patent: 5315241 (1994-05-01), Ewers
patent: 5491111 (1996-02-01), Tai
Kobert Russel M.
Nguyen Vinh P.
Semicoa Semiconductors
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