Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Reexamination Certificate
2006-02-28
2006-02-28
Clark, S. V. (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Alignment marks
C257S698000
Reexamination Certificate
active
07005754
ABSTRACT:
A method and apparatus for aligning a semiconductor device with a corresponding landing site on a carrier substrate. At least two apertures are formed in a semiconductor device, the apertures passing from a first major surface to a second, opposing major surface of the semiconductor device. Corresponding alignment features are provided on the carrier substrate at the landing site to which the semiconductor device is to be mounted. The alignment features are aligned with the corresponding apertures to effect alignment of the semiconductor device. The alignment features may include apertures corresponding in size, shape and arrangement to the semiconductor device apertures. Alignment pins may be placed through the at least two apertures to assist with alignment.
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Clark S. V.
Micro)n Technology, Inc.
TraskBritt PC
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