Radiant energy – Ionic separation or analysis
Reexamination Certificate
2006-01-03
2006-01-03
Lee, John R. (Department: 2881)
Radiant energy
Ionic separation or analysis
C250S282000, C250S283000, C250S299000, C250S300000
Reexamination Certificate
active
06982413
ABSTRACT:
The present invention provides methods and electronic circuits for a chemical analyzer, for example, a mass spectrometer, which provide generated signals that are maintained to a required level of precision. A user may specify the required precision for the signals which operate the spectrometer and may specify the required precision for the mass analysis, either explicitly or by choosing a predefined configuration. The spectrometer will then generate the signals to the required precision despite changes in operating conditions, environmental conditions, component aging and degradation, or other nonfailure effects that otherwise affect analyzer calibration and signal output. The electronic circuits incorporate signal monitoring to maintain closed-loop signal control. The closed-loop control includes a feedback path which may include discrete components and may include software enabling a processor to adjust the generated signals to maintain the required precision of the signals and analysis. Further, the spectrometer may monitor signals and analyze and store data in order to predict future performance, including precision, analysis limitations, impending component degradation or failure, or another parameter associated with a component or signal of the spectrometer. Specifically, a range for a particular parameter may be specified and a indication provided to a user when the parameter exceeds the specified range.
REFERENCES:
patent: 3495186 (1970-02-01), Wright
patent: 3621464 (1971-11-01), Bryndza
patent: 4757198 (1988-07-01), Korte et al.
patent: 5579202 (1996-11-01), Tolfsen et al.
patent: 5734163 (1998-03-01), Hayashi et al.
patent: 5755744 (1998-05-01), Shaw et al.
patent: 6014587 (2000-01-01), Shaw et al.
patent: 6205043 (2001-03-01), Chutjian et al.
patent: 6353324 (2002-03-01), Uber et al.
patent: 6414318 (2002-07-01), Uber et al.
patent: 6434031 (2002-08-01), Chutjian et al.
patent: 6583702 (2003-06-01), Chutjian et al.
patent: 2004/0183006 (2004-09-01), Reilly et al.
patent: 2004/0236603 (2004-11-01), Heller et al.
patent: 2005/0051720 (2005-03-01), Knecht et al.
Knecht Brent A.
Patterson Garth E.
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Griffin Analytical Technologies, Inc.
Lee John R.
Souw Bernard E.
LandOfFree
Method of automatically calibrating electronic controls in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of automatically calibrating electronic controls in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of automatically calibrating electronic controls in a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3564076