Method of automatically and electronically analyzing patterns in

Image analysis – Histogram processing – For setting a threshold

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358101, 358107, 356237, G06K 900

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047208708

ABSTRACT:
Patterns (f) in a scene (S) are analyzed in order to automatically distinguish symmetrical perceptible areas (P) in the pattern (f), even if said symmetrical perceptible areas (P) are intersected by auxiliary patterns (F). A digitized image (Id) is used, and a test point (cO) located inside the digitized pattern (fd) is used as a starting point. A sequence of circles of increasing diameter is drawn around the test point. Whenever one such circle (CO.sup.i) intersects the digitized pattern (fd) a new center (c1) is chosen, offset from the preceding center (c0) in a direction going away from the point of intersection. By iteration, a sequence of test points (cn) is thus constructed which, for a symmetrical pattern, converges on its center of symmetry (c).

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patent: 4593406 (1986-06-01), Stone
patent: 4661984 (1987-04-01), Bentley
Danielsson et al, "Distance Checking Algorithms", Linkoping University, Department of Electrical Engineering, S-581 83, Linkoping, Sweden, LiTH-ISY-I-0175, 9/21/1977.

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