Method of automated quantitative analysis of distortion in...

Details Method of automated quantitative analysis of distortion in... Method of automated quantitative analysis of distortion in...

2007-12-14

2008-12-30

Stafira, Michael P (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

Reexamination Certificate

active

07471383

ABSTRACT:
The present application describes and claims an opto-electronic method of quantitatively analyzing reflected optical distortion in sheets or panels of shaped glass.

REFERENCES:
patent: 2902898 (1959-09-01), Kops
patent: 5367378 (1994-11-01), Harding
patent: 6100990 (2000-08-01), Ladewski
patent: 6392754 (2002-05-01), Pingel et al.

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