Turning – Process of turning
Patent
1996-10-10
1999-08-24
Pitts, Andrea L.
Turning
Process of turning
82 47, B23B 100
Patent
active
059411430
ABSTRACT:
A method is provided for assessing chip breaking performance of a selected tool insert used in finish turning for automated machining operations. The method broadly includes the steps for developing a chip groove classification system based upon selected geometric parameters of commercially available tool inserts. Additionally, the method includes creating a fuzzy rule base utilizing the chip groove classification system and actual chip breaking performance data for the commercially available tool inserts. The fuzzy rule base is then used for assessing the chip breaking performance of the selected tool insert. The method takes into account selected geometric parameters, such as, land, primary rake, secondary rake, groove width, groove depth, groove height and slope of backwall.
REFERENCES:
patent: 4549270 (1985-10-01), Fukumura et al.
patent: 4887221 (1989-12-01), Davis et al.
patent: 4896273 (1990-01-01), Moore et al.
patent: 5075866 (1991-12-01), Goto et al.
patent: 5249135 (1993-09-01), Fujita
patent: 5267141 (1993-11-01), Morita et al.
patent: 5285378 (1994-02-01), Matsumoto
patent: 5289367 (1994-02-01), Sasaki et al.
patent: 5357439 (1994-10-01), Matsuzaki et al.
patent: 5377116 (1994-12-01), Wayne et al.
patent: 5378218 (1995-01-01), Daimaru et al.
patent: 5473532 (1995-12-01), Unno et al.
patent: 5517537 (1996-05-01), Greene et al.
patent: 5689062 (1997-11-01), Jawahir et al.
Jawahir, I.S. et al.; Recent Developments in Chip Control Research and Applications; Annals of the Cirp; vol. 42, No. 2; 1993 659-693.
Jawahir, I.S. et al.; The tool Resticted Contact Effect as a Major Influencing Factor in Chip Breaking: An Experimental Analysis; Annals of the Cirp; vol. 37,3; p. 121-6.
Fei et al., "A Fuzzy Classification Technique for Predictive Assesment of Chip Breakability for Use in Intelligent Machining Systems", IEEE 2nd International Conference on Fuzzy Systems, p. 1275, Apr. 1993.
Ghosh Ranajit
Jawahir Ibrahim S.
Lin Marshall M.
Pitts Andrea L.
Tsai Henry W. H.
University of Kentucky Research Foundation
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