Method of applying parametric oscillators to model...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination

Reexamination Certificate

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C703S002000

Reexamination Certificate

active

07110912

ABSTRACT:
Methodology for segmentally modeling Real and Imaginary Parts of Optical Constants or Dielectric Functions using Kroneig-Kramer (K-K) Consistant Oscillators with substantially definite start and end points.

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patent: 6485872 (2002-11-01), Rosenthal et al.
patent: 6654873 (2003-11-01), Kadowaki
patent: 6819845 (2004-11-01), Lee et al.
patent: 6862095 (2005-03-01), Horie

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