Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Patent
1986-06-10
1988-04-19
Bueker, Richard R.
Radiation imagery chemistry: process, composition, or product th
Including control feature responsive to a test or measurement
430270, 430311, 430322, 430327, 430935, 427 9, 427240, G03C 500
Patent
active
047389109
ABSTRACT:
A photoresist process which comprises a process for spin-coating a substrate with a resist, a process for transferring a mask pattern onto the coated resist film followed by exposure, and a developing process for forming a pattern on the substrate after the pattern has been exposed. When the developed pattern of the resist pulsates with the increase or decrease of parameters in the process for applying resist, the value of the parameter is set to a value that corresponds to an extreme value of the pulsation.
REFERENCES:
patent: 4500615 (1985-02-01), Iwai
Ito Tetsuo
Kadota Kazuya
Kobayashi Kazunari
Nakagomi Yoshiyuki
Tanuma Masaya
Bueker Richard R.
Dees Jos,e G.
Hitachi , Ltd.
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