Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Reexamination Certificate
2008-08-18
2009-12-01
Porta, David P (Department: 2884)
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
C382S274000
Reexamination Certificate
active
07626175
ABSTRACT:
According to one embodiment, a system for linearizing image data corresponding to one or more objects and output by an imaging device is provided. The system includes a processor configured for: receiving the image data from the imaging device; and producing a generally linear relationship between the image data and a thickness of the one or more objects. The generally linear relationship is produced according to the equationI=Ioⅇull.I is an intensity of the image data, I0is an intensity of energy produced by the imaging device for outputting the image data, μ is an attenuation coefficient of the one or more objects, and l is the thickness of the one or more objects.
REFERENCES:
V. Dorobantu, “X-rays linear attenuation coefficient in steel. I. Thickness dependence,” NDT.net, Dec. 2004, vol. 12, No. 12.
U.S. Appl. No. 12/193,321, filed Aug. 18, 2008, Srinivasan et al.
Hamblin Michael W.
Reichert Peter A.
Srinivasan Govindarajan T.
Wrinn Joseph F.
Foley & Lardner LLP
Gaworecki Mark R
Maraia Joseph M.
Porta David P
Teradyne, Inc.
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