Method of and system for measuring temperature and spectral fact

Details Method of and system for measuring temperature and spectral fact Method of and system for measuring temperature and spectral fact

1980-08-27

1983-10-25

Punter, William H.

Optics: measuring and testing

Optical pyrometers

Plural color responsive

356406, G01J 560, G01N 2127

Patent

active

044115199

ABSTRACT:
Methods and systems for measuring the temperature and spectral factors of a number of specimens (or radiators). The radiant flux from the specimens are spectrally analyzed with respect to effective wavelengths from M different channels (M being greater than or equal to 3). A relation among the spectral radiant flux intensity, approximated spectral factor (depending only on wavelength) and the temperature is determined for each channel by using Planck's radiation law with the condition that a relation N+K=M is kept among M of the number of channels, N of the number of specimens with unknown temperature values and K of the number of unknown terms of the approximated spectral factor of the specimens. Strict algebraic development of such relation is employed to cancel out all of the unknown terms of the spectral factor to obtain a one-dimensional equation concerning the sole temperature. Such equation is solved to determine the temperature of the specimens, and the spectral factor of the specimens is obtained from the determined temperature values and the aforesaid relation.

REFERENCES:
patent: 3654809 (1972-04-01), Worden et al.
patent: 3922550 (1975-11-01), Crowley et al.
patent: 4061428 (1977-12-01), Amano et al.
patent: 4278349 (1981-07-01), Sander
patent: 4319830 (1982-03-01), Roach
Tskhai, N. S. "Spectral Method of Determining the Emissivity of Hot Surfaces", Jr. of App. Spectrosc. (USA), vol. 27, #3, 9-1977, published 3-1978, pp. 1111-1115.

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