Method of and system for high-speed, high-accuracy functional te

Details Method of and system for high-speed, high-accuracy functional te Method of and system for high-speed, high-accuracy functional te

1988-01-27

1989-10-10

Smith, Jerry

Excavating

371 27, G06F 1100

Patent

active

048737054

ABSTRACT:
A method of and system of high-speed, high-accuracy functional testing of memories in microprocessor-based units or boards under test includes a test system that is effectively permanently coupled to the unit under test bus structure during test execution and operates at the unit under test's clock rate. The test program may be stored in the unit under test's own memory, or may be electrically transferred from the test system's memory to the memory under test using a memory overlay technique.
Memory testing speed may be further incresed by taking advantage of block move and compare features of newer microprocessors. An algorithm which exploits the block move and compare features is provided.

REFERENCES:
patent: 4061908 (1977-12-01), de Jonge
patent: 4485435 (1984-11-01), Sibley
patent: 4569048 (1986-02-01), Sargent
patent: 4631724 (1986-12-01), Shimizu
patent: 4707834 (1987-11-01), Frisch
patent: 4715034 (1987-12-01), Jacobson
patent: 4757503 (1988-07-01), Hayes
patent: 4782487 (1988-11-01), Smelser

Affiliated with

Also associated with

Rating

Method of and system for high-speed, high-accuracy functional te does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of and system for high-speed, high-accuracy functional te, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of and system for high-speed, high-accuracy functional te will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1962253