Method of and system for fast functional testing of random acces

Details Method of and system for fast functional testing of random acces Method of and system for fast functional testing of random acces

1985-03-04

1987-12-22

Smith, Jerry

Excavating

371 25, 365201, G06F 1126

Patent

active

047150343

ABSTRACT:
Random bits are written successively into the cells of a random access memory (RAM) system, then complemented, through a first sequence of cell addresses distributed substantially uniformly throughout all the cells of the memory. Through an opposite address sequence, the contents of the cells are read and then complemented. Finally, through the initial sequence of cell addresses, the contents of the cells are again read. Differences between read and expected cell contents identify memory cell faults. The random bits preferably are generated by a softward implemented, reversible pseudorandom sequence generator, and the uniform address sequence is generated by an address hasher programmed with an address function that exercises all address lines essentially equally.

REFERENCES:
patent: 3579199 (1971-05-01), Anderson
patent: 3719929 (1973-03-01), Fay
patent: 3924181 (1975-12-01), Alderson
patent: 4061908 (1977-12-01), de Jonge
patent: 4195770 (1980-04-01), Benton
patent: 4342084 (1982-07-01), Sager
patent: 4380068 (1983-04-01), de Couasnon
patent: 4414665 (1983-11-01), Kimura
patent: 4429389 (1984-01-01), Catiller
patent: 4442519 (1984-04-01), Jones
D. G. East, "Address Generation for Array Testing", IBM Technical Disclosure Bulletin, vol. 21, No. 12, 5/1979, p. 4942.
W. H. McAnney, J. Savir, & S. R. Vecchio, "Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory", paper 3.3, 1985, International Test Conference, IEEE, 1985.
J. Savir, W. H. McAnney, & S. R. Vecchio, "Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory", paper 3.4, 1985, International Test Conference, IEEE 1985.
J. Savir, G. S. Ditlow, P. H. Bardell, "Random Pattern Testability, IEEE Transactions on Computers, vol. C-33, No. 1, Jan. 1984.
J. Savir, P. H. Bardell, "On Random Pattern Test Length", IEEE Transactions on Computers, vol. C-33, No. 6, Jun. 1984.

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