X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2008-08-18
2010-10-26
Glick, Edward J (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S019000, C378S062000, C378S098800, C378S098120
Reexamination Certificate
active
07819581
ABSTRACT:
According to one embodiment, a calibration system for calibrating image data produced by an imaging system is provided. The calibration system includes a processor configured for: receiving the image data from the imaging system; receiving a plurality of reference values from the imaging system; and calibrating the image data using the reference values. The reference values correspond to air image data produced by the imaging system.
REFERENCES:
patent: 6748046 (2004-06-01), Thayer
patent: 7330535 (2008-02-01), Arenson et al.
patent: 7476026 (2009-01-01), Braunstein
U.S. Appl. No. 12/193,235, filed Aug. 18, 2008, Reichert et al.
Doi et al., “Real-time X-ray Inspection of 3-D Defects in Circuit Board Patterns,” IEEE Proceedings of the Fifth International Conference on Computer Vision, 1995, pp. 575-582.
Hamblin Michael W.
LaFosse Dennis R.
Reichert Peter A.
Srinivasan Govindarajan T.
Wrinn Joseph F.
Artman Thomas R
Glick Edward J
Teradyne, Inc.
Wolf Greenfield & Sacks P.C.
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