Thermal measuring and testing – Thermal testing of a nonthermal quantity
Patent
1994-01-24
1994-10-04
Gutierrez, Diego F. F.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
374161, 374 4, 356371, 356448, 250571, G01N 2500, G01N 2155, G01B 1130
Patent
active
053520386
ABSTRACT:
With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a roughened material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the known surface roughness of the material is stored in a comparison device. This comparison device is fed a set value for the desired surface roughness. The infrared temperature of a material surface, initially unknown with respect to its surface roughness, is measured and compared with the stored temperature variation, in order to determine the magnitude of the surface roughness. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material.
REFERENCES:
patent: 3206603 (1965-09-01), Mauro
patent: 3433052 (1969-03-01), Maley
patent: 3667846 (1972-06-01), Nater et al.
patent: 3771880 (1973-11-01), Bennett
patent: 3922093 (1975-11-01), Dandliker et al.
patent: 3973122 (1976-08-01), Goldberg
patent: 3978713 (1976-09-01), Penney
patent: 4012141 (1977-03-01), Hanneman
patent: 4017188 (1977-04-01), Sawatary
patent: 4136566 (1979-01-01), Christensen
patent: 4278353 (1981-07-01), Ostermayer, Jr.
patent: 4290698 (1981-09-01), Milana
patent: 4511800 (1985-04-01), Harbeke et al.
patent: 4521118 (1985-06-01), Rosencwaig
patent: 4522510 (1985-06-01), Rosencwaig et al.
patent: 4579463 (1986-04-01), Rosencwaig et al.
patent: 4634290 (1987-01-01), Rosencwaig et al.
patent: 4634294 (1987-01-01), Christol et al.
patent: 4679946 (1987-07-01), Rosencwaig et al.
patent: 4803374 (1989-02-01), Monfort et al.
patent: 4973164 (1990-11-01), Weber et al.
patent: 4986672 (1991-01-01), Beynon
patent: 5103106 (1992-04-01), Golberstein
patent: 5118945 (1992-06-01), Winschuh et al.
Patent Abstracts of Japan, vol. 12, No. 51 (P-667) Feb. 16, 1988 (an abstract of JP-A-62 198 707 (Nippon Kokan KK <NKK>) Sep. 2, 1987) (only abstract considered).
C. Linhart and A. Weckenmann, "Contactless Evaluation of the Thickness of Surface Coatings with Thermal Effects," Technisches Messen TM. Bd. 49, Nr. 11, Nov. 1982, Munchen DE, pp. 391-398.
Sick GmbH Optik-Elektronik, "SORM Sick Optical Roughness Measuring System" (no date).
"Profile Measuring Station RM 600 2-D" (1990).
Haas Raimund
Mackert Walter
Ruckszio Manfred
Schmidt Hugo
Gutierrez Diego F. F.
Hoechst Aktiengesellschaft
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