Method of and measuring arrangement for contactless on-line meas

Details Method of and measuring arrangement for contactless on-line meas Method of and measuring arrangement for contactless on-line meas

1993-06-04

1994-10-25

Gutierrez, Diego F. F.

Thermal measuring and testing

Distance or angle

Thickness, erosion, or deposition

374 45, 374 5, 250560, 250562, G01N 2500, G01N 2117, G01N 2572, G01B 1106

Patent

active

053583337

ABSTRACT:
With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the surface condition of the material is stored in a comparison device. A set value for the desired surface condition is fed to this comparison device. The infrared temperature of a material surface, initially unknown with respect to its surface condition, is measured and compared with the stored temperature variation in order to determine the magnitude of the surface parameter. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material.

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