Method of and device for inspecting pattern of printed circuit b

Details Method of and device for inspecting pattern of printed circuit b Method of and device for inspecting pattern of printed circuit b

1991-07-16

1992-11-03

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

358107, G06K 900

Patent

active

051612020

ABSTRACT:
Respective images of a conductive pattern and through holes of a printed circuit board are obtained. The through holes are classified into normal through holes having a relatively large diameter and mini via holes having a comparatively small diameter. The mini via hole image is enlarged to become an enlarged mini via hole image (SHSm). The image of the conductive pattern has hole parts therein, which are filled with images generated from the normal through hole image and the mini via hole image to obtain a corrected pattern image (CPS). The edge of the corrected pattern image is detected and enlarged to obtain an enlarged edge image (SES). The enlarged edge image is classified into two areas, one of which overlaps with the enlarged mini via hole image (SHSm). These two areas are subjected to inspection in different inspection modes.

REFERENCES:
patent: 4866629 (1989-09-01), Chen et al.
patent: 4908871 (1990-03-01), Hara et al.
patent: 5018211 (1991-05-01), Jaffe et al.
patent: 5027417 (1991-06-01), Kitakado et al.

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