Method of and arrangement for measuring low capacitances

Details Method of and arrangement for measuring low capacitances Method of and arrangement for measuring low capacitances

1986-11-13

1988-10-04

Scott, J. R.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

324 60CD, G01R 2726

Patent

active

047758309

ABSTRACT:
Method of and arrangement for measuring low capacitances include generating a periodic frequency signal having time periods of duration dependent on capacitance, and alternately connecting an unknown capacitance to be measured and a known reference capacitance, one after the other, to a frequency generator for an equal number of time periods of the frequency signal. Each time period has a first and a second time interval proportional to the reference capacitance and the unknown capacitance, respectively. A DC voltage output signal proportional to the unknown capacitance being measured is generated in response to the durations of the first and second time intervals. The DC voltage output signal is preferably scaled, linearized and temperature compensated.

REFERENCES:
patent: 3012193 (1961-12-01), Breen
patent: 4187460 (1980-02-01), Dauge et al.
patent: 4339709 (1982-07-01), Brihier

Affiliated with

Also associated with

Rating

Method of and arrangement for measuring low capacitances does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of and arrangement for measuring low capacitances, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of and arrangement for measuring low capacitances will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2157807