Method of and apparatus for thermal analysis, method of and...

Details Method of and apparatus for thermal analysis, method of and... Method of and apparatus for thermal analysis, method of and...

2005-04-19

2005-04-19

Picard, Leo (Department: 2125)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Mechanical control system

C700S276000, C700S299000, C219S494000, C219S497000

Reexamination Certificate

active

06882902

ABSTRACT:
The physical property data of the object to be heated, set temperatures of heaters and blowers are provided to a reflow apparatus, and view factor setting data for determining the view factor of the surface-mounted circuit board are input. From the input these data, the number of heaters and blowers, and the heating characteristic data peculiar to the reflow apparatus, such as the heat transfer coefficient, the speed of conveyor and the like, the view factor is simply determined, and the temperature of the surface-mounted circuit board at the time of passing through the reflow apparatus is calculated with respect to the board and parts mounted thereon, using the determined view factor.

REFERENCES:
patent: 6382497 (2002-05-01), Nagafuku et al.
patent: 6501051 (2002-12-01), Richert et al.
patent: 3-50790 (1991-03-01), None
patent: 11-201647 (1999-07-01), None

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