Method of and apparatus for the automatic diagnosis of the failu

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324 73R, G01R 3128

Patent

active

044596936

ABSTRACT:
This disclosure is concerned with the automatic diagnosis of the failure of tri-state, two-state and other electrical or electronic devices or components connected to common bus nodes through the pulling of such nodes to high or low voltage state levels during the disabling of all devices connected to the common bus node(s) in order to determine if a failed device is interfering with the normal bus operation; and if so, to proceed automatically to compare parametric measurements of the failed common bus node(s) with purposefully failed selected devices, one by one, to locate the device interfering with the normal bus operation.

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"L135 LSI Board Test System", Teradyne, Inc., Boston, Mass., Feb. 78, Pub. F691.
"Genrad 2270 In-Circuit Test System" Manual, Genrad, Waltham, Mass.
P. Thompson, Node Forcing Techniques, Marconi Instrumentation vol. 17, No. 2, May 1980, pp. 31-33.

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